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    <lastBuildDate> Thu, 2 Aug 2007 21:36:34 -0400 </lastBuildDate>
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    <title> IP.com Patent Debate - 20050185590: Methods and systems for simultaneous, multi-channel link fault sectionalization testing  </title>
    <link> http://www.patentdebate.com/PATAPP/20050185590 </link>
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20050185590 - Methods and systems for simultaneous, multi-channel link fault sectionalization testing
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      <link> http://www.patentdebate.com/PATAPP/20050185590?tab=posts#com_id_16 </link>
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    <pubDate> Fri, 3 Aug 2007 01:36:34 -0400 </pubDate>
      <description> null&lt;br/&gt;
&lt;small&gt;Posted by huangxintian, 2007-08-03 01:36:34&lt;/small&gt; </description>
      <source url='http://www.patentdebate.com/rss/20050185590.xml'> IP.com Patent Debate: 20050185590 </source>
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      <title> 20050185590: Methods and systems for simultaneous, multi-channel link fault sectionalization testing </title>
      <link> http://www.patentdebate.com/PATAPP/20050185590 </link>
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    <pubDate> Thu, 25 Aug 2005 00:00:00 -0400 </pubDate>
      <description> &lt;div class="maincontent"&gt;&lt;table width="100%" border="0" cellpadding="3" cellspacing="0"&gt;&lt;tr valign="top"&gt;&lt;td align="right"&gt; Assignee: &lt;/td&gt;&lt;td&gt;Tekelec&lt;/td&gt;&lt;/tr&gt;&lt;tr valign="top"&gt;&lt;td align="right"&gt; Filed: &lt;/td&gt;&lt;td&gt;30-Aug-2004&lt;/td&gt;&lt;/tr&gt;&lt;tr valign="top"&gt;&lt;td align="right"&gt;Abstract:&lt;/td&gt;&lt;td&gt;
Method and systems for simultaneously performing link fault sectionalization (LFS) tests for multiple time division multiplexed (TDM) channels are disclosed. An LFS test state machine may simultaneously process test data for multiple TDM channels by receiving test data associated with the TDM channels, accessing stored LFS state information associated with the TDM channels from an LFS state storage element, sequentially processing the test data for the channels, generating new LFS state information for each channel, and storing the new LFS state information in the LFS state storage element. 
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