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20050185590 View on USPTO site 30-Aug-2004

Methods and systems for simultaneous, multi-channel link fault sectionalization testing


Pub. No / Pub. Date:20050185590 / 25-Aug-2005
Inventor(s): Lam T. Ngo (US)
Erick T. Swanson (US)
Peter J. Marsico (US)
Correspondence Address: JENKINS, WILSON & TAYLOR, P. A.

3100 TOWER BLVD
SUITE 1400
DURHAM, NC 27707 (US)
Assignee(s): Tekelec
Serial No. / Filed Date:10929292 / 30-Aug-2004
U.S. class:370/241
International class:H04L 12/26
Related Application Data:
  • provisional application No. 60545874, filed on 19-Feb-2004
Abstract: Method and systems for simultaneously performing link fault sectionalization (LFS) tests for multiple time division multiplexed (TDM) channels are disclosed. An LFS test state machine may simultaneously process test data for multiple TDM channels by receiving test data associated with the TDM channels, accessing stored LFS state information associated with the TDM channels from an LFS state storage element, sequentially processing the test data for the channels, generating new LFS state information for each channel, and storing the new LFS state information in the LFS state storage element.

 
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